JPK Instrumencts AG
JPK Instruments has one goal:
Giving the customers dealing with problems on the nanoscale the best instruments and best services for their needs. They bridge the worlds of nanotechnology tools and life science applications with cutting-edge technology and unique applications expertise.
How to reach this ambitious goal?
They believe strongly that success comes only by listening to the needs of customers in detail to develop an understanding of their challenges and providing a reliable and innovative solution. The JPK development team works in collaboration with an international network of leading scientists and industry experts to develop premium class instruments.
As a qualified and reliable partner, they help their customers apply their technologies to their research - worldwide.
Atomic Force Microscopy:
NanoWizard® 3 NanoScience AFM:
The new NanoWizard® 3 NanoOptics AFM is optimized for a broad range of applications ranging from nanoscale optical imaging by aperture and scattering-type SNOM to experiments involving interactions of light with the sample such as absorption, excitation, nonlinear effects and quenching.
- QI™ quantitative imaging mode for the most challenging of AFM samples
- Comprehensive solutions for AFM and Raman spectroscopy, Tip-Enhanced Raman Spectroscopy (TERS), Aperture SNOM and Scattering-type SNOM (sSNOM), Confocal microscopy, NanoManipulation in optical fields
- Compatible with most commercially available inverted research microscopes (Zeiss Axiovert and Axio Observer lines, Nikon TE and Ti lines, Olympus IX line and Leica DMI line)
- Unique integration with optical microscopy by tip and sample scanning design, DirectOverlay™ mode and smart engineering
- Seamless integration with inverted microscopes, Raman spectrometers, photon counting systems
- Highest stability and lowest drift for long term experiments
- Up to 6 axes closed-loop scanning (3 by tip and 3 by sample) with the TAO™ module
- Designed for optimum imaging in air or liquid with excellent resolution, lowest noise and maximum versatility
- Expanded flexibility with the widest range of modes and accessories with the Vortis™ controller and the latest NanoWizard® software
980nm laser source for cantilever deflection detection prevents cross talk with other wavelengths - Wide range of operation modes and accessories such as Tuning Fork, STM, Conductive AFM, Fiber SNOM
A NanoWizard® 3 Bio Science AFM:
The NanoWizard® 3 BioScience AFM is the only AFM system on the market which is designed for optimal use in liquid and comes with a vapor barrier, encapsulated piezos and a variety of dedicated liquid cells for applications ranging from single molecules to living cells. Of course, one can use the system in air or controlled environment too.
The system comes with the QI™ mode - a new force curve based imaging mode for the most challenging of AFM samples - as a standard.
From the beginning the NanoWizard® has set the standard for optical integration with full condenser capabilities and DirectOverlay™. With the NanoWizard® 3 comes a technology breakthrough in AFM - HyperDrive™ - an imaging technique for soft samples in liquid which provides SuperResolution with minimized tip-sample interactions.
- HyperDrive™ provides SuperResolution for soft samples in liquid
- Patented DirectOverlay™ software feature for combining AFM and optical images distortion free
- State-of-the-art Vortis™ digital controller with lowest noise levels and highest number of signal channels
- In-situ imaging in biological/chemical fluids or in air
- Measurements at variable temperatures with perfusion possibilities
- Large scan field of 100×100×15 µm3 with highest closed loop performance through capacitive sensors
Automated Force Spectorscopy:
Force Robot 300:
Using the ForceRobot® overcomes the limitations of traditional force measurements. The ForceRobot® automates routine procedures and provides software support for experimental design, data acquisition and evaluation.
- Fully automated force spectroscope with highest flexibility
- Cutting edge force spectroscopy and force mapping in combination with single molecule fluorescence
- Automated laser and detector alignment
- Automated cantilever drift compensation
- Advanced and dedicated software with ExperimentPlanner™, RampDesigner™ and built-in data batch processing
- Fits to the Vortis™ controller
Optical Tweezers/3D Particle Tracking:
Nano tracker:
With the NanoTracker™, the user can trap and track particles from several µm down to 30nm with the ability to control, manipulate and observe samples from vesicles to whole cells in real time with nanometer precision.
NanoTracker™ technology provides precisely quantifiable and reproducible measurements of particle/ cell interactions. The system delivers precise information about single molecule mechanics and may also be used to determine mechanical characteristics such as adhesion, elasticity or stiffness on single molecules.
- Real-time data - essential for living cell studies
- Optical Tweezers meets 3D particle tracking
- 3D real space tracking information with nanometer precision
- Use of biochemically modified nanoparticles
- No perturbation of the biological system
- Reproducible and calibrated data
- Quantitative results from mechanical properties to diffusion
Cellular Adhesion/Cytemechanics:
Cellhesion 200:
The single cell force testing solution for cell adhesion and elasticity studies
Providing reproducible quantitative results for single cells with precision down to the single-molecule level - the innovative CellHesion® methodology opens up new paths for the study of cellular interactions with results of a completely new quality level. Data can be measured for a number of important parameters involved in cellular adhesion, including maximum cell adhesion force, single unbinding events, tether characteristics, and work of removal.
- Innovative platform for adhesion/cell mechanics research for measurements from single-molecules to entire cells
- Cantilever sensor lifting system with >110µm travel range with closed-loop control through high-speed capacitive sensor feedback
- Integrates with advanced optical imaging (DIC, CLSM, TIRF, FRET ...)
- Works in native environment for real in-situ measurements
- Fits to the Vortis™ controller
